~~NOTOC~~
====== Set of heavy-ion beam runs ======
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  * ** Date: ** 2016.12.10 to 2016.12.13.  \\ 
  * ** Facility: ** Texas A&M Cyclotron Institute. \\
  * ** Tests category: ** Dynamic tests. \\
  * ** DUT: ** V7-585 . \\
  * ** Infrastructure: ** \\
    * DUT onboard JPL's "CPU" daughterboard; \\
    * XRTC's gen-2 (Virtex-2-Pro) motherboard; \\
    * BYU's JCM module; \\
    * Brain-boxes (data buffers); \\
    * Bench power supplies. \\
  * ** Primitives tested: ** \\ 
    * BRAM memory blocks; \\
      * with ECC primitive enabled, and disabled. \\
    * IOB blocks with signaling std. LVCMOS (HR, 3V3); \\
      * registered, and un-registered. \\


===== A note on EM noise =====
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There is too much electrical noise (here often referred as simply "glitches") present in logged data, from run 53 onwards. \\
We applied a filtering method suggested by Gary: for a given counter sequence, identify nearby (+delta_count) and (-delta_count) with identical absolute value, and replace those with zero. 
This effectively removed noise but it still remains a significant amount of artifacts out of the considered pattern, preventing us to correctly identify dynamic events that should appear as small delta-counts. 
We can only reliably extract static, CRAM hits statistics from the noisy data, by considering counters and groups of counters running for long times (up to the scrubbing action fixing the interconnects/configuration).     

===== Specific types of tests performed =====
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  * ** [[data_analysis:v7-dynamic:201612-tamu:bram| BRAM & BRAM-ECC blocks Data Analysis ]] ** 
  * ** [[data_analysis:v7-dynamic:201612-tamu:iob| IOB blocks Data Analysis ]] **  
